Abstract: XRD analysis is used to identify the crystalline phases present in a material and thereby reveal chemical composition information. X-ray diffraction is useful for evaluating minerals, polymers, corrosion products, and unknown materials. In most cases, samples are analyzed by powder diffraction using samples prepared as finely ground powders. XRD analysis is performed by directing an x-ray beam at a sample and measuring the scattered intensity as a function of the outgoing direction, also called a diffraction pattern. The diffraction pattern characterize the crystal structure. X-Ray Diffraction analysis is used to determine crystalline structure parameters. The XRD measurements of all the samples have been carried out and characterized by 2.2 kw sealed Bruker D8 Advance X-ray diffractometer available at UGC DAE CSR, Indore, India. The data of all these samples have been processed by Origin computer software. The crystallite size and lattice parameter of the copper (II) mixed ligand complexes with 2-amino-3-hydroxypicolinamide have been reported.
Keywords: Diffraction, copper, crystallite size, lattice parameter.
Title: XRD Analysis of Copper (II) Mixed Ligand Complexes with 3-hydroxypicolinamide and Determination of Crystallite Size and Lattice Parameters
Author: A. Rammaiya, N. Parsai, P. Sharma, A. Mishra
International Journal of Interdisciplinary Research and Innovations
ISSN 2348-1218 (print), ISSN 2348-1226 (online)
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